薄膜类型 | 制备方法 | 响应度(A/W) | 暗电流(A) | 光暗电流比 | 参考文献 |
Ga2O3 | 分子束外延 | 3.7 × 10−2 | 10−9 | - | [43] |
Ga2O3 | 磁控溅射 | 1.19 × 10−3 | 10−12 | 105 | [14] |
Ga2O3 | 分子束外延 | - | 10−11 | 102 | [44] |
Ga2O3 | 分子束外延 | - | 10−7 | 15 | [45] |
HB-Ga2O3 | 磁控溅射 | - | 1.2 × 10−8 | 4 × 101 | [18] |
Zn: Ga2O3 | 化学气相沉积 | 2.1 × 102 | 10−11 | 5 × 104 | [46] |
Sn: Ga2O3 | - | 3.05 | 10−11 | 104 | [47] |
Sn: Ga2O3 | 化学气相沉积 | 3.61 × 10−2 | 10−8 | 19 | [48] |
Sn: Ga2O3 | 分子束外延 | 9.6 × 10−2 | 10−9 | 1.4 × 102 | [49] |
Al: Ga2O3 | 分子束外延 | 1.5 | - | - | [50] |
Si: Ga2O3 | 化学气相沉积 | 6 × 101 | - | 9 | [48] |
Si: Ga2O3 | 化学气相沉积 | 3.6 × 101 | - | 9 | [51] |
Nb: Ga2O3 | 磁控溅射 | - | 2 × 10−10 | 2.5 × 102 | [30] |